Ioannis Voyiatzis: search on Z-Library

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1

An efficient built-in self test method for robust path delay fault testing

Ioannis Voyiatzis, Antonis Paschalis, Dimitrios Nikolos, Constantin Halatsis

Journal:

Journal of Electronic Testing

Year:

1996

Language:

english

File:

PDF, 246 KB

english, 1996

2

[IEEE 2012 16th Panhellenic Conference on Informatics (PCI) - Piraeus, Greece (2012.10.5-2012.10.7)] 2012 16th Panhellenic Conference on Informatics - Design and Implementation of an E-exam System Based on the Android Platform

Meletiou, George, Voyiatzis, Ioannis, Stavroulaki, Vera, Sgouropoulou, C.

Year:

2012

Language:

english

File:

PDF, 318 KB

english, 2012

3

[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - Accumulator-based test-per-clock scheme for low-power on-chip application of test patterns

Voyiatzis, Ioannis

Year:

2014

Language:

english

File:

PDF, 169 KB

english, 2014

4

[IEEE 2009 13th Panhellenic Conference on Informatics - Corfu, Greece (2009.09.10-2009.09.12)] 2009 13th Panhellenic Conference on Informatics - Embedding Test Patterns in Accumulator-Generated Sequences in O(1) Time

Ioannidis, Nestor, Voyiatzis, Ioannis

Year:

2009

Language:

english

File:

PDF, 248 KB

english, 2009

5

[IEEE 2014 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Santorini, Greece (2014.5.6-2014.5.8)] 2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - DTIS 2014 foreword

Voyiatzis, Ioannis, Renovell, M., Masmoudi, M., Prinetto, Paolo, Di Natale, Giorgio

Year:

2014

File:

PDF, 55 KB

2014

6

[ACM Press the 19th Panhellenic Conference - Athens, Greece (2015.10.01-2015.10.03)] Proceedings of the 19th Panhellenic Conference on Informatics - PCI '15 - On the use of hard faults to generate test sets

Voyiatzis, Ioannis, Efstathiou, Costas

Year:

2015

Language:

english

File:

PDF, 100 KB

english, 2015

7

Collaborative activities recommendation based on studentsâ collaborative learning styles using ANN and WSM

Troussas, Christos, Giannakas, Filippos, Sgouropoulou, Cleo, Voyiatzis, Ioannis

Journal:

Interactive Learning Environments

Year:

2020

File:

PDF, 1.68 MB

2020

8

Accumulator Based 3-Weight Pattern Generation

Paschalis, Antonis, Voyiatzis, Ioannis, Gizopoulos, Dimitris

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2012

Language:

english

File:

PDF, 437 KB

english, 2012

9

[IEEE 2010 International Conference on Microelectronics (ICM) - Cairo, Egypt (2010.12.19-2010.12.22)] 2010 International Conference on Microelectronics - On the modulo 2n+1 subtract units for weighted operands

Efstathiou, Costas, Voyiatzis, Ioannis

Year:

2010

Language:

english

File:

PDF, 761 KB

english, 2010

10

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - A Low-Cost Accumulator-Based Test Pattern Generation Architecture

Magos, Dimitrios, Voyiatzis, Ioannis, Tarnick, Steffen

Year:

2008

Language:

english

File:

PDF, 348 KB

english, 2008

11

An Accumulator—Based Test-Per-Clock Scheme

Magos, Dimitrios, Voyiatzis, Ioannis, Tarnick, Steffen

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2011

Language:

english

File:

PDF, 560 KB

english, 2011

12

Fractal Dimension Analysis Applied to Soil CO2 Fluxes in Campotostoâs Seismic Area, Central Italy

DâIncecco, Simone, Di Carlo, Piero, Aruffo, Eleonora, Chatzisavvas, Nikolaos, Petraki, Ermioni, Priniotakis, Georgios, Voyiatzis, Ioannis, Yannakopoulos, Panayiotis H., Nikolopoulos, Dimitrios

Journal:

Year:

2020

File:

PDF, 3.22 MB

2020

13

A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences

Voyiatzis, Ioannis

Journal:

Year:

2008

Language:

english

File:

PDF, 596 KB

english, 2008

14

[IEEE 2015 20th IEEE European Test Symposium (ETS) - Cluj-Napoca, Romania (2015.5.25-2015.5.29)] 2015 20th IEEE European Test Symposium (ETS) - Symmetric transparent on-line BIST of word-organized memories with binary adders

Voyiatzis, Ioannis

Year:

2015

Language:

english

File:

PDF, 160 KB

english, 2015

15

[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - Concurrent online BIST for sequential circuits exploiting input reduction and output space compaction

Voyiatzis, Ioannis

Year:

2014

Language:

english

File:

PDF, 150 KB

english, 2014

16

[IEEE 2009 3rd International Conference on Signals, Circuits and Systems (SCS 2009) - Medenine, Tunisia (2009.11.6-2009.11.8)] 2009 3rd International Conference on Signals, Circuits and Systems (SCS) - Handling zero in diminished-1 modulo 2n + 1 subtraction

Efstathiou, Costas, Voyiatzis, Ioannis

Year:

2009

Language:

english

File:

PDF, 307 KB

english, 2009

17

Long-Lasting Patterns in 3 kHz Electromagnetic Time Series after the ML = 6.6 Earthquake of 2018-10-25 near Zakynthos, Greece

Nikolopoulos, Dimitrios, Petraki, Ermioni, Yannakopoulos, Panayiotis H., Priniotakis, Georgios, Voyiatzis, Ioannis, Cantzos, Demetrios

Journal:

Year:

2020

File:

PDF, 1.84 MB

2020

18

Ensemble Learning Using Fuzzy Weights to Improve Learning Style Identification for Adapted Instructional Routines

Troussas, Christos, Krouska, Akrivi, Sgouropoulou, Cleo, Voyiatzis, Ioannis

Journal:

Year:

2020

File:

PDF, 1.36 MB

2020

19

Input Vector Monitoring Concurrent BIST Architecture Using SRAM Cells

Voyiatzis, Ioannis, Efstathiou, Costas

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2014

Language:

english

File:

PDF, 902 KB

english, 2014

20

[IEEE 2014 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Santorini, Greece (2014.5.6-2014.5.8)] 2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - On the design of efficient modulo 2n+1 multiply-add-add units

Efstathiou, Constantinos, Tsoumanis, Kostas, Pekmestzi, Kiamal, Voyiatzis, Ioannis

Year:

2014

Language:

english

File:

PDF, 1.01 MB

english, 2014

21

Joint special Issue from best papers of DTIS'10 and DTIS'11

Bernard, Serge, Masmoudi, Mohamed, Voyiatzis, Ioannis

Journal:

Microelectronics Journal

Year:

2013

Language:

english

File:

PDF, 133 KB

english, 2013

22

[IEEE 2017 22nd IEEE European Test Symposium (ETS) - Limassol, Cyprus (2017.5.22-2017.5.26)] 2017 22nd IEEE European Test Symposium (ETS) - SIC pair generation in optimal time using rotatable counters

Voyiatzis, Ioannis

Year:

2017

Language:

english

File:

PDF, 250 KB

english, 2017

23

Surface characterization of monolithic zirconia submitted to different surface treatments applying optical interferometry and raman spectrometry

TZANAKAKIS, Emmanouil, KONTONASAKI, Eleana, VOYIATZIS, George, ANDRIKOPOULOS, Konstantinos, TZOUTZAS, Ioannis

Journal:

Dental Materials Journal

Year:

2019

File:

PDF, 2.85 MB

2019

24

Accumulator-based pseudo-exhaustive two-pattern generation

Ioannis Voyiatzis

Journal:

Journal of Systems Architecture

Year:

2007

Language:

english

File:

PDF, 403 KB

english, 2007

25

Aliasing Reduction in Accumulator-Based Response Verification

Voyiatzis, Ioannis

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2014

Language:

english

File:

PDF, 813 KB

english, 2014

26

Comparative Transcriptome Analysis of Two Olive Cultivars in Response to NaCl-Stress

Bazakos, Christos, Manioudaki, Maria E., Therios, Ioannis, Voyiatzis, Demetrios, Kafetzopoulos, Dimitris, Awada, Tala, Kalaitzis, Panagiotis, Provart, Nicholas James

Journal:

Year:

2012

Language:

english

File:

PDF, 1.69 MB

english, 2012

27

[IEEE 2015 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Montpellier, France (2015.7.8-2015.7.10)] 2015 IEEE Computer Society Annual Symposium on VLSI - Modulo 2n ± 1 Fused Add-Multiply Units

Efstathiou, Constantinos, Tsoumanis, Kostas, Pekmestzi, Kiamal, Voyiatzis, Ioannis

Year:

2015

Language:

english

File:

PDF, 260 KB

english, 2015

28

[IEEE 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Crete, Greece (2007.07.8-2007.07.11)] 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Embedding test patterns into Low-Power BIST sequences

Voyiatzis, Ioannis

Year:

2007

Language:

english

File:

PDF, 138 KB

english, 2007

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